To match the surface characterization techniques with their surface properties, we need to understand the specific properties each technique evaluates:
1. Scanning electron microscopy (P):
This technique provides high-resolution images of surfaces, primarily used for analyzing topography (the detailed surface structure). Thus, P–N is the correct match.
2. Fourier-transform Infrared spectroscopy (Q):
FTIR is used to identify functional groups in materials by analyzing absorption spectra. Therefore, Q–M is the correct match.
3. X-ray photoelectron spectroscopy (R):
XPS is used to determine the elemental composition of surfaces by analyzing the emitted photoelectrons. Hence, R–K is the correct match.
4. Atomic force microscopy (S):
AFM is primarily used to measure roughness and the topography of surfaces on the nanoscale. Thus, S–L is the correct match.
Therefore, the correct answer is (B).